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IEEE Design and Test of Computers
Journal Abbreviation:
IEEE DES TEST COMPUT
ISSN:
0740-7475
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publications (4)
Types of publications
Journal article
Journal article
Unpublished / Preprint
Unpublished / Preprint
Publication year
From
To
Abstract
Filters (inactive)
Guest Editors’ Introduction: Special Issue on Time-Critical Systems Design Part II (2018)
Mitra T, Teich J, Thiele L
Journal article, Editorial
Time-Critical Systems Design: A Survey (2018)
Mitra T, Teich J, Thiele L
Journal article
Guest Editors’ Introduction: Special Issue on Time-Critical Systems Design (2018)
Mitra T, Teich J, Thiele L
Journal article
Recap of the 2016 DATE Conference & Exhibition (2016)
Fanucci L, Teich J
Journal article