Materials Science in Semiconductor Processing

Journal Abbreviation: MAT SCI SEMICON PROC
ISSN: 1369-8001
Publisher: Elsevier

Publications (9)

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Unpublished / Preprint

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Investigation of amorphous-SiC thin film deposition by RF magnetron sputtering for optical applications (2024) Chaussende D, Tabouret V, Crisci A, Morais M, Coindeau S, Berthomé G, Kollmuß M, et al. Journal article Low-temperature performance of GeSn-on-Si avalanche photodiodes toward single-photon detection (2024) Wanitzek M, Hack M, Schwarz D, Schulze J, Oehme M Journal article Utilizing direct Zener tunneling in Germanium for cryogenic quantum applications (2024) Hack M, Seidel L, Wanitzek M, Oehme M, Schulze J, Schwarz D Journal article First-principles investigations of structural, electronic and thermoelectric properties of Sb/Bi2Se3 van der Waals heterostructure (2022) Ait Tamerd M, Marjaoui A, El Kasmi A, Assebban M, Diani M, Zanouni M Journal article Defect reduction in SiC epilayers by different substrate cleaning methods (2022) Baierhofer D, Thomas B, Staiger F, Marchetti B, Foerster C, Erlbacher T Journal article Wavelength-selective 4H-SiC UV-sensor array (2019) Matthus CD, Bauer AJ, Frey L, Erlbacher T Journal article, Original article An adhesive bonding approach by hydrogen silsesquioxane for silicon carbide-based LED applications (2019) Lin L, Ou Y, Jokubavicius V, Syväjärvi M, Liang M, Liu Z, Yi X, et al. Journal article, Original article From thin film to bulk 3C-SiC growth: Understanding the mechanism of defects reduction (2018) La Via F, Severino A, Anzalone R, Bongiorno C, Litrico G, Mauceri M, Schöler M, et al. Journal article, Original article Improved electrical behavior of ZrO2-based MIM structures by optimizing the O3 oxidation pulse time (2015) Paskaleva A, Weinreich W, Bauer A, Lemberger M, Frey L Journal article, Original article