IEEE Transactions on Device and Materials Reliability

Journal Abbreviation: IEEE T DEVICE MAT RE
ISSN: 1530-4388
Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publications (1)

Charge Trapping Analysis of Metal/Al2O3/SiO2/Si, Gate Stack for Emerging Embedded Memories (2017) Khosla R, Rolseth EG, Kumar P, Vadakupudhupalayam SS, Sharma SK, Schulze J Journal article