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IEEE Transactions on Device and Materials Reliability
Journal Abbreviation:
IEEE T DEVICE MAT RE
ISSN:
1530-4388
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publications (1)
Types of publications
Journal article
Journal article
Unpublished / Preprint
Unpublished / Preprint
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Filters (inactive)
Charge Trapping Analysis of Metal/Al2O3/SiO2/Si, Gate Stack for Emerging Embedded Memories (2017)
Khosla R, Rolseth EG, Kumar P, Vadakupudhupalayam SS, Sharma SK, Schulze J
Journal article