IEEE Transactions on Instrumentation and Measurement

Journal Abbreviation: IEEE T INSTRUM MEAS
ISSN: 0018-9456
Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publications (24)

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Unpublished / Preprint

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Abstract

Determination of Dynamic Material Properties of Silicone Rubber Using One-Point Measurements and Finite Element Simulations (2012) Ilg J, Rupitsch S, Sutor A, Lerch R Journal article Tip Clearance Measurement Technique for Stationary Gas Turbines Using an Autofocusing Millimeter-Wave Synthetic Aperture Radar (2012) Schicht A, Schwarzer S, Schmidt LP Journal article A Novel System for Systematic Microwave Noise and DC Characterization of Terahertz Schottky Diodes (2004) Biber S, Cojocari O, Rehm G, Mottet B, Rodriguez-Girones M, Schmidt LP, Hartnagel H Journal article Novel opportunities for optical level gauging and 3D-imaging with the photoelectronic mixing device (2002) Gulden P, Vossiek M, Heide P, Schwarte R Journal article
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