IEEE Transactions on Electron Devices
Journal Abbreviation: IEEE T ELECTRON DEV
ISSN: 0018-9383
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Publications (19)
Sub-0.2 V impact ionization in Si n-i-p-i-n diode (2016)
Das B, Sushama S, Schulze J, Ganguly U
Journal article
Tuning the Ge(Sn) tunneling FET: Influence of drain doping, short channel, and Sn content (2015)
Haehnel D, Fischer IA, Hornung A, Koellner AC, Schulze J
Journal article
Charge pumping measurements on differently passivated lateral 4H-SiC MOSFETs (2015)
Salinaro A, Pobegen G, Aichinger T, Zippelius B, Peters DP, Friedrichs P, Frey L
Journal article, Original article
Contactless Functionality Inspection of Flat-Panel-Display Pixels and Thin-Film Transistors by Capacitive Coupling (2012)
Koerdel M, Alatas F, Schick A, Jongman J, Sekhar C, Rupitsch S, Lerch R
Journal article
Significant on-resistance reduction of LDMOS devices by intermitted trench gates integration (2012)
Erlbacher T, Bauer AJ, Frey L
Journal article, Original article
Contactless Inspection of Flat-Panel Displays and Detector Panels by Capacitive Coupling (2011)
Koerdel M, Alatas F, Schick A, Kragler K, Weisfield RL, Rupitsch S, Lerch R
Journal article
Very high room-temperature peak-to-valley current ratio in Si Esaki tunneling diodes (March 2010) (2010)
Oehme M, Sarlija M, Haehnel D, Kaschel M, Werner J, Kasper E, Schulze J
Journal article
Correcting the Output Conductance for Self-Heating in InAlAs/InGaAs HBTs (2006)
Weiß O, Baureis P, Kellmann N, Weber N, Weigel R
Journal article
Flexible Organic Complementary Circuits (2005)
Klauk H, Halik M, Zschieschang U, Eder F, Rhode D, Schmid G, Dehm C
Journal article, Report