Microelectronics Reliability
Journal Abbreviation: MICROELECTRON RELIAB
ISSN: 0026-2714
Publisher: Elsevier
Publications (23)
Non-destructive imaging of defects in Ag-sinter die attach layers – A comparative study including X-ray, Scanning Acoustic Microscopy and Thermography (2018)
Dreher P, Schmidt R, Vetter A, Hepp J, Karl A, Brabec C
Journal article, Original article
Normalized differential conductance to study current conduction mechanisms in MOS structures (2018)
Nouibat TH, Messai Z, Chikouch D, Ouennoughi Z, Rouag N, Rommel M, Frey L
Journal article, Original article
Pulse Plated Silver Metallization on Porosified Low Temperature Co-fired Ceramics for High Frequency Applications (2016)
Steinhäußer F, Talai A, Sandulache G, Weigel R, Kölpin A, Hansal W, Bittner A, Schmid U
Journal article
Current conduction mechanism of MIS devices using multidimensional minimization system program (2015)
Rouag, N, Ouennoughi Z, Rommel M, Murakami K, Frey L
Journal article, Original article
Resilience Articulation Point (RAP): Cross-layer Dependability Modeling for Nanometer System-on-Chip Resilience (2014)
Herkersdorf A, Aliee H, Engel M, Glaß M, Gimmler-Dumont C, Henkel J, Kleeberger VB, et al.
Journal article
Analytical stress characterization after different chip separation methods (2014)
Fügl M, Mackh G, Meissner E, Frey L
Journal article, Original article
Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiC (2013)
Ouennoughi Z, Strenger C, Bourouba F, Haeublein V, Ryssel H, Frey L
Journal article, other
Leakage current and defect characterization of p+n-source/drain diodes (2011)
Roll G, Goldbach M, Frey L
Journal article, Original article
Investigation of the reliability of 4H-SiC MOS devices for high temperature applications (2011)
Le-Huu M, Schmitt H, Noll S, Grieb M, Schrey FF, Bauer AJ, Frey L, Ryssel H
Journal article, Original article
Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor (2005)
Lemberger M, Paskaleva A, Zürcher S, Bauer A, Frey L, Ryssel H
Journal article, Original article