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IEEE International Test Conference (TC)
ISSN:
1089-3539
Publisher:
Institute of Electrical and Electronics Engineers
Publications (1)
Types of publications
Journal article
Journal article
Unpublished / Preprint
Unpublished / Preprint
Publication year
From
To
Abstract
Filters (inactive)
The Best of Both Worlds: Merging the Benefits of Rack&Stack and Universal ATE (2009)
Lu P, Glaser D, Uygur G, Helmreich K
Conference contribution