Solid-State Electronics

Journal Abbreviation: SOLID STATE ELECTRON
ISSN: 0038-1101
Publisher: Elsevier

Publications (11)

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Unpublished / Preprint

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Abstract

Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation (2011) Roll G, Jakschik S, Burenkov A, Goldbach M, Mikolajick T, Frey L Journal article, Original article
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