Proceedings of SPIE
ISSN: 0277-786X
Publisher: Society of Photo-optical Instrumentation Engineers (SPIE)
Publications (396)
New Developments in Laser Processing of Silicon Devices (2003)
Dirscherl M, Eßer G
Conference contribution
Ubiquitous coherence - boon and bale of the optical metrologist (2003)
Häusler G
Journal article
Miniature interferometers for applications in microtechnology and nanotechnology (2003)
Jäger G, Manske E, Hausotte T, Füßl R, Grünwald R, Büchner HJ, Schott W, Dontsov D
Conference contribution
RF-sensor for a local position measurement system (2003)
Stelzer A, Fischer A, Weinberger F, Vossiek M
Conference contribution
Innovative optical components and their impact on future transmission systems (2003)
Schmauß B, Striegler A, Meißner M
Conference contribution
Four-port on Wafer Measurement of Coupled Transmission Lines on LTCC (2003)
Ziegler C, Nisznansky M, Schmidt LP, Hocke R, Wohlgemuth O
Conference contribution
Broadband Electrical Design and Modelling of Packages Integrated in LTCC-Substrate (2003)
Nisznansky M, Ziegler C, Schmidt LP, Hocke R, Wohlgemuth O
Conference contribution
Generation of functional structures by laser pyrolysis of polysilazane (2002)
Krauß HJ, Otto A
Conference contribution
Lateral Shearing Interferometer for Phase Shift Mask Measurement at 193 nm (2002)
Lindlein N
Journal article
Nanopositioning and - measuring technique (2002)
Jäger G, Manske E, Hausotte T, Büchner HJ, Grünwald R
Conference contribution