Modelling-Augmented Failure Diagnostics in Planar SiC MOS Devices Using TDDB Measurements (2024) Cornigli D, Schlichting H, Becker T, Larcher L, Erlbacher T, Pešić M Journal article Plasma Treatment after NiSi-Based Ohmic Contact Formation on 4H-SiC to Enhance Adhesion of Subsequent Backside Metallization (2024) Becker T, Hellinger C, Fuchs A, Körfer J, Rusch O Journal article In Situ Monitoring of the Ambient Gas Phase during PVT Growth of Nominally Undoped High Resistivity SiC Boules (2023) Ihle J, Wellmann P Book chapter / Article in edited volumes Transfer of Heteroepitaxial Grown 3C-SiC Layers for Application in Optical Frequency Combs (2023) Kollmuß M, Shi X, Ou H, Wellmann P Book chapter / Article in edited volumes Prevention of Bunched Basal Plane Dislocation Arrays in 4H-SiC PVT-Growth (2023) Steiner J, Nguyen BD, Sandfeld S, Wellmann P Book chapter / Article in edited volumes Investigation of the Nucleation Process During the Initial Stage of PVT Growth of 4H-SiC (2023) Strüber S, Arzig M, Steiner J, Salamon M, Uhlmann N, Wellmann P Book chapter / Article in edited volumes Chemical bonded oil-ptfe-pa66 composites as novel tribologically effective materials: Part 1 (2021) Nguyen TD, Gedan-Smolka M, Kamga LS, Sauer B, Emrich S, Kopnarski M, Voit B Conference contribution Wafer container monitoring concerning airborne molecular contaminations along a 300 mm power semiconductor production flow (2021) Franze P, Schneider G, Kaskel S Conference contribution Analysis of EL emitted by LEDs on Si substrates containing GeSn/Ge multi quantum wells as active layers (2016) Schwartz B, Saring P, Arguirov T, Oehme M, Kostecki K, Kasper E, Schulze J, Kittler M Conference contribution Ge and GeSn light emitters on Si (2016) Oehme M, Gollhofer M, Kostecki K, Koerner R, Bechler S, Widmann D, Arguirov T, et al. Conference contribution