FEI Helios NanoLab 660 (FEI)

Model: Helios NanoLab660

Manufacturer: FEI (2013)

URL: https://www.em.tf.fau.de/research/equipment/helios-nanolab-660/

Location: Erlangen

Usage: For external users too

Pictures

Equipment picture
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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

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To

Abstract

Journal

Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM (2020) Schweizer P, Denninger P, Dolle C, Spiecker E Journal article Mechanical cleaning of graphene using in situ electron microscopy (2020) Schweizer P, Dolle C, Dasler D, Abellán G, Hauke F, Hirsch A, Spiecker E Journal article Correlative Laboratory Nano-CT and 360° Electron Tomography of Macropore Structures in Hierarchical Zeolites (2020) Apeleo Zubiri B, Wirth J, Drobek D, Englisch S, Przybilla T, Weissenberger T, Schwieger W, Spiecker E Journal article Defect Engineering of Two-Dimensional Molybdenum Disulfide (2020) Chen X, Denninger P, Stimpel-Lindner T, Spiecker E, Duesberg GS, Backes C, Knirsch K, Hirsch A Journal article
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