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FEI Helios NanoLab 660 (FEI)

Model: Helios NanoLab660

Manufacturer: FEI (2013)

URL: https://www.em.tf.fau.de/research/equipment/helios-nanolab-660/

Location: Erlangen

Usage: For external users too

Organisation(s):

Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

Funding Sources:

DFG / Exzellenzcluster (EXC)

Involved Person(s):

Johannes Will Contact person

Pictures

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• Publications

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name_de: FEI Helios NanoLab 660
name_en: FEI Helios NanoLab 660
model: Helios NanoLab660
url: https://www.em.tf.fau.de/research/equipment/helios-nanolab-660/
manufacturer: FEI
year: 2013
location_de: Erlangen
location_en: Erlangen
usage_de: Auch für externe Nutzer
usage_en: For external users too
description_de:

The FEI Helios NanoLab 660 dualbeam System combines ultra-high resolution SEM imaging with extremely precise FIB milling. Having 8 different detectors, the instrument is capable of resolving a large variety of signals like secondary electrons, x-rays, and secondary ions. Using the Ga-ion FIB material can be removed with nanometer precision to prepare site-specific cross-sections, TEM lamellae or structures for mechanical tests. Three different gas injection systems are available that can be used for different purposes. Carbon and Platinum can be deposited in order to protect a surface or to do circuit editing, while XeF₂ can be used for ion-less milling of certain materials. In addition Two micro-manipulators are available for lift-out procedures, sample transfers and mechanical or electrical probing.

description_en: <p>The FEI Helios NanoLab 660 dualbeam System combines ultra-high resolution SEM imaging with extremely precise FIB milling. Having 8 different detectors, the instrument is capable of resolving a large variety of signals like secondary electrons, x-rays, and secondary ions. Using the Ga-ion FIB material can be removed with nanometer precision to prepare site-specific cross-sections, TEM lamellae or structures for mechanical tests. Three different gas injection systems are available that can be used for different purposes. Carbon and Platinum can be deposited in order to protect a surface or to do circuit editing, while XeF₂ can be used for ion-less milling of certain materials. In addition Two micro-manipulators are available for lift-out procedures, sample transfers and mechanical or electrical probing.</p>
feature_de:

• Ultra-high resolution Elstar^TM electron column with monochromator
• Resolution ~1 nm at 1-30 kV
• Retractable STEM and different SE & BSE detectors for advanced imaging contrasts
• High-resolution Tomahawk^TM ion column
• Gas Injection System for Pt, C and XeF₂
• EasyLift NanoManipulator
• Kleindiek micromanipulator
• Oxford X-Max^N EDX detector (150 mm² SDD)
• In-chamber plasma cleaner

feature_en: <p></p><ul><li>Ultra-high resolution Elstar^TM electron column with monochromator</li><li>Resolution ~1 nm at 1-30 kV</li><li>Retractable STEM and different SE & BSE detectors for advanced imaging contrasts</li><li>High-resolution Tomahawk^TM ion column</li><li>Gas Injection System for Pt, C and XeF₂</li><li>EasyLift NanoManipulator</li><li>Kleindiek micromanipulator</li><li>Oxford X-Max^N EDX detector (150 mm² SDD)</li><li>In-chamber plasma cleaner</li></ul><p></p>
pictures: <QuerySet [<Picture: 224722056>]>
cards: <QuerySet [<Card: Card of Johannes, Will: (True)>]>
funding_sources: <QuerySet [<FundingSource: FundingSource: cris_id: 139454987, name: DFG / Exzellenzcluster (EXC), abbreviation: EXC>]>
projects: <QuerySet [<Project: Center for Nanoanalysis and Electron Microscopy (CENEM), CENEM, , , <div>The Center for Nanoanalysis and Electron Microscopy (CENEM) is a facility featuring cutting-edge instrumentation, techniques and expertise required for microscopic and analytical characterization of materials and devices down to the atomic scale. CENEM focuses on several complementary analysis techniques, which closely work together: Electron Microscopy, X-ray Microscopy, Cryo-TEM, Scattering Methods, Scanning Probes and Atom Probe Microscopy. With the combination of these methods new materials, particles, structures and devices are characterized not only microscopically and analytically on all length scales even down to the atomic scale but also by various in situ investigations and 3D methods. The knowledge gained through the versatile characterization methods is then used to further develop and improve materials and devices.</div> <p> </p><div>CENEM was established in 2010 to provide a forefront research center for the versatile characterization of materials and devices with state-of-the-art instrumentation and expertise and to intensify the interdisciplinary research. The big CENEM network represents the strong collaborations within the University of Erlangen-Nürnberg as well as the collaboration with other universities, dedicated research institutes and industry.</div> <p> </p><p>The support of the core facility CENEM by the German Science Foundation (DFG) and the Cluster of Excellence EXC 315 “Engineering of Advanced Materials” is gratefully acknowledged.</p>, , 2010-01-01, 2038-03-03, , 2038-03-03, FAU own research funding: EFI / IZKF / EAM ..., True>, <Project: In-situ Characterization of Nanomaterials with Electrons, X-rays/Neutrons and Scanning Probes (GRK 1896), GRK 1896, , , <p> Research into innovative nanostructured materials is of fundamental importance for Germany’s technological competitiveness and in addressing global challenges, like the development of renewable energy sources. Nanostructured materials are controlled by size and interfaces, which give rise to enhanced mechanical properties and new physical effects leading in turn to new functionalities. The design of novel nanostructured materials and devices such as flexible electronics demands state-of-the-art nanocharacterisation tools. In particular, methods based on short-wave radiation (electrons, X-rays/neutrons) or scanning probes are ideally suited to analyse materials at the nanometer and atomic scale. Recently developed in situ capabilities and the use of complementary characterisation methods allow unique insights into the structure formation, functionality and deformation behaviour of complex nanostructures. These new in situ techniques will be the future key tools for the development of new materials and devices. The doctoral programme combines, for the first time, these three pillars of nanocharacterisation into a structured Research Training Group. The main objective of this programme is to provide the next generation of scientists and engineers with comprehensive, method-spanning and interdisciplinary training in the application of cutting-edge nanocharacterisation tools to materials and device development. Within the programme, the in situ methods will be further developed and used to address fundamental questions regarding the growth, stability and functionality of complex nanostructures and interfaces. Project area A "Functional Nanostructures and Networks" will address the properties of individual nano-objects and how these translate into functionality when assembled to nano-networks. In Project area B "Mechanical Properties of Interfaces" various kinds of interfaces with different bonding characteristics and morphologies will be studied in well-defined loading scenarios. This parallel, complementary study of both functional and mechanical materials properties over several length scales by multiple in situ methods is unprecedented. Our PhD candidates will be well-positioned in a network of international collaborations and highly trained in multiple, complementary techniques, providing them with an essential foundation for a successful career in the field of advanced materials and devices development.</p>, , 2013-10-01, 2022-09-30, , 2022-09-30, Third Party Funds Group - Overall project, True>, <Project: Hybride semiconductors – metal nanowire composites for opto-electronic devices (GRK1896-A6), GRK1896-A6, , In-situ Characterization of Nanomaterials with Electrons, X-rays/Neutrons and Scanning Probes (GRK 1896), <p>Project A6 combines the findings from the first funding period, which investigated the transport properties of metallic nanowires as well as inorganic nanoparticles as a function of microstructure and microstructure with c-AFM and electron microscopy methods. The follow-up project will address the electrical and optical properties of nanoparticle-filled nanowire composites. The focus of the investigations is on the microscopic understanding of the charge carrier transport between the semiconducting matrix and the metallically conductive nanowires. In situ X-ray spectroscopy under light (c-AFM and STM) should provide insight into the electrical processes at the interfaces.</p>, , 2013-10-01, 2017-09-30, 2022-09-30, 2022-09-30, Third Party Funds Group - Sub project, True>, <Project: Mechanical switching of molecules on surfaces (GRK1896-B1), GRK1896-B1, , In-situ Characterization of Nanomaterials with Electrons, X-rays/Neutrons and Scanning Probes (GRK 1896), <p>Scanning probe microscopy allows quantitative measurements of structural, mechanical and electronic properties of molecular systems on metal surfaces. Using scanning tunneling microscopy, atoms and molecules can be manipulated in a controlled manner and their electronic density of states is measured.  The forces needed to manipulate and deform individual molecules are often unknown. In this project area, the forces between individual molecules, as well as molecular switches on surfaces, are investigated on a quantitative basis by means of atomic force microscopy and spectroscopy.</p>, , 2013-10-01, 2017-09-30, 2022-09-30, 2022-09-30, Third Party Funds Group - Sub project, True>, <Project: Structural changes in nanoparticles under pressure loading (GRK1896-B2), GRK1896-B2, , In-situ Characterization of Nanomaterials with Electrons, X-rays/Neutrons and Scanning Probes (GRK 1896), <p>The adhesion and friction of particles is of enormous importance in numerous technological applications. At the same time, the physical processes of ​​contact between particles and substrates, in particular in the lower nm range, are often not completely understood. Contact forces of particles on surfaces and between particles strongly depend on the local contact geometry, in particular the local roughness. These nanostructures in the range <100 nm strongly variable in size. They determine the acting adhesive forces which change as the roughness changes due to elastic and inelastic deformation. The description of these deformations, however, is largely incomplete and is therefore studied in this project.</p>, , 2013-10-01, 2017-09-30, 2022-09-30, 2022-09-30, Third Party Funds Group - Sub project, True>, <Project: 3D-deformation behavior of nanoporous metals and nanocomposites (GRK1896-B4), GRK1896-B4, , In-situ Characterization of Nanomaterials with Electrons, X-rays/Neutrons and Scanning Probes (GRK 1896), <p>Project B4 will be realigned during the second funding phase to introduce the possibilities of the high-resolution X-ray microscope and to use it for a cross-scale investigation of mechanical size effects. The project focuses on the new X-ray microscope Zeiss Xradia Ultra 810, which complements the already established tomography techniques in CENEM (360 ° ET, 3D-FIB, APT) across scales. The device currently has the highest spatial resolution of a laboratory device (<50 nm) and is equipped with a micromechanical in situ loading unit. This allows correlated mechanical and structural 3D analyzes, which are established in cooperation with Project Z. D The 3D data obtained from X-ray tomography are used to elucidate the deformation behavior for cross-scale correlative simulations (FEM / MD). In addition to the tomographic examinations, further methods of electron microscopy and X-ray scattering are used to elucidate the structure. </p>, , 2013-10-01, 2017-09-30, 2022-09-30, 2022-09-30, Third Party Funds Group - Sub project, True>, <Project: Structure-property relations of individual nanowires (GRK1896-A1), GRK1896-A1, , In-situ Characterization of Nanomaterials with Electrons, X-rays/Neutrons and Scanning Probes (GRK 1896), <p> Silver nanowire networks are very promising as flexible electrode for organic (opto)electronics.  They fulfill the requirement of a low sheet resistance combined with high transmittance and macroscopic bending tests show excellent performance. In order to understand failure mechanisms and prospectively optimize the deformation behavior of AgNW electrodes <em>in situ</em> mechanical testing in the TEM is conducted. <em>In situ</em> tensile tests of single Ag NWs  as well as Ag NW networks are conducted in this project in order to perform scale bridging failure analysis</p>, , 2013-10-01, 2017-09-30, 2022-09-30, 2022-09-30, Third Party Funds Group - Sub project, True>, <Project: CENEM Core Facility (CENEM), CENEM, , , <p> Das Erlanger Center for Nanoanalysis and Electron Microscopy (CENEM) bietet komplement&auml;re Ex-pertisen und Gro&szlig;ger&auml;te f&uuml;r die Nanomaterialcharakterisierung und spielt als interdisziplin&auml;re Einrich-tung im Forschungsschwerpunkt Materialien und Prozesse der Universit&auml;t eine wichtige Rolle. Ge-gr&uuml;ndet als Teil des Exzellenzclusters Engineering of Advanced Materials &uuml;bernimmt es eine zentrale Funktion f&uuml;r die Materialforschung in Erlangen und ist in koordinierte Forschungsprogramme einge-bunden. Die Universit&auml;tsleitung hat das CENEM mit seinen Bereichen Elektronenmikroskopie, Streumethoden und Sondenmikroskopie durch gezielte Berufungen gest&auml;rkt und bei der Beschaffung von Gro&szlig;ger&auml;ten unterst&uuml;tzt. So betreibt das CENEM exzellente Gro&szlig;ger&auml;te mit weiter Sichtbarkeit &uuml;ber die Universit&auml;t hinaus, darunter ein aberrationskorrigiertes Titan3 80-300 TEM und ein weltweit einmaliges Gro&szlig;kammer-REM mit M&ouml;glichkeiten der mechanischen in situ Pr&uuml;fung. Aufbauend auf der stark nachgefragten Elektronenmikroskopie User Facility soll im Rahmen dieses Projektes eine deutschlandweit einmalige Core Facility aufgebaut werden, die Wissenschaftlern aus Forschung und Industrie die Expertisen und Gro&szlig;ger&auml;te aller drei Bereiche zug&auml;nglich macht. Das vorgelegt Konzept zielt darauf ab, die Core Facility als hochattraktive Anlaufstation f&uuml;r Fragen der Nanocharakterisierung von Materialien zu etablieren und eine effiziente Nutzung der Ger&auml;te zu realisieren.</p>, , 2012-03-01, , , 2015-03-01, Third party funded individual grant, True>, <Project: Aberration-Corrected High-Resolution and in situ Transmission Electron Microscopy of Carbon Allotropes and Related Device Structures (Z02) (SFB 953), SFB 953, , SFB 953: Synthetic Carbon Allotropes (SFB 953), <p> Im vorliegenden wissenschaftlichen Zentralprojekt sollen die weitreichenden M&ouml;glichkeiten des neuen aberrationskorrigierten Transmissionselektronenmikroskops FEI Titan3 80-300 eingesetzt werden, um in enger Kooperation mit den anderen Projekten einzelne C-Allotrope, C-basierte Kompositstrukturen, sowie abgeleitete d&uuml;nne Schichten und Bauelemente auf atomarer Skala zu untersuchen. Unter anderem wollen wir die chemische Funktionalisierung von Graphen untersuchen, Querschnitts-analysen an C-basierten Bauelementen durchf&uuml;hren, die 3D-Struktur von BHJFilmen tomographisch charakterisiern sowie in-situ nanomechanische Tests zur Exfoliation von Graphen durchf&uuml;hren.</p>, , 2012-01-01, , , 2015-01-01, Third Party Funds Group - Sub project, True>, <Project: High resolution transmission electron microscopy investigation of the atomic structure of defects and interfaces in single crystal superalloys (A07) (TRR 103), TRR 103, , TRR 103: Vom Atom zur Turbinenschaufel - wissenschaftliche Grundlagen für eine neue Generation einkristalliner Superlegierungen, <p> Das Projekt A7 nutzt die neuen M&ouml;glichkeiten der aberrationskorrigierten hochaufl&ouml;senden TEM f&uuml;r Untersuchungen der atomaren Struktur und Chemie von Grenzfl&auml;chen und Defekten in der &gamma;/&gamma;&rsquo;-Mikrostruktur und deren Bedeutung f&uuml;r die Elementarprozesse bei der Hochtemperaturverformung. Die Relevanz der lokalen Analysen wird durch neue Verfahren der Zielpr&auml;paration sowie eine enge Zusammenarbeit mit den Projekten, die sich mit komplement&auml;ren mikroskopischen Verfahren, den mechanischen Eigenschaften und der Modellierung befassen, sichergestellt. Das Projekt &uuml;bernimmt zudem alle weiteren hochaufl&ouml;senden TEM-Analysen im SFB.</p>, , 2012-01-01, , , 2015-01-01, Third Party Funds Group - Sub project, True>]>
publications: <QuerySet [<Publication: Influence of substrate polarity on thermal stability, grain growth and atomic interface structure of Au thin films on ZnO surfaces>, <Publication: Characterization of extended defects in 2D materials using aperture-based dark-field STEM in SEM>, <Publication: Influence of Au alloying on solid state dewetting kinetics and texture evolution of Ag and Ni thin films>, <Publication: Structural Evolution of GaOx-Shell and Intermetallic Phases in Ga-Pt Supported Catalytically Active Liquid Metal Solutions>, <Publication: Catalyst Supraparticles: Tuning the Structure of Spray-Dried Pt/SiO2 Supraparticles via Salt-Based Colloidal Manipulation to Control their Catalytic Performance>, <Publication: Dewetting of Pt Nanoparticles Boosts Electrocatalytic Hydrogen Evolution Due to Electronic Metal-Support Interaction>, <Publication: Photodeposition-Based Synthesis of TiO2@IrOx Core–Shell Catalyst for Proton Exchange Membrane Water Electrolysis with Low Iridium Loading>, <Publication: Solution-Growth Liquid-Phase Epitaxy of CsPbBr3 on NaCl by Optimizing the Substrate Dissolution>, <Publication: Reliable identification of the complex or superlattice nature of intrinsic and extrinsic stacking faults in the L12 phase by high-resolution imaging>, <Publication: Controlled Self-Assembly of Gold Nanotetrahedra into Quasicrystals and Complex Periodic Supracrystals>, <Publication: Between defects and inclusions: The fate of tellurium in pyrite>, <Publication: Influence of tin oxide decoration on the junction conductivity of silver nanowires>, <Publication: 3D analysis of equally X-ray attenuating mineralogical phases utilizing a correlative tomographic workflow across multiple length scales>, <Publication: Preparation of geometrically highly controlled Ga particle arrays on quasi-planar nanostructured surfaces as a SCALMS model system>, <Publication: A Sustainable Method for Removal of the Full Range of Liquid and Solid Hydrocarbons from Water Including Up- and Recycling>, <Publication: Synergistic Combination of Reductive Covalent Functionalization and Atomic Layer Deposition—Towards Spatially Defined Graphene-Organic-Inorganic Heterostructures>, <Publication: Efficient, stable, and fully printed carbon-electrode perovskite solar cells enabled by hole-transporting bilayers>, <Publication: pH dependence of the decomposition behavior of urogynecological fixation materials>, <Publication: Shape-Controlled Solution-Epitaxial Perovskite Micro-Crystal Lasers Rivaling Vapor Deposited Ones>, <Publication: Structural reorientation and compaction of porous MoS2 coatings during wear testing>, '...(remaining elements truncated)...']>
fobes: <QuerySet []>
orgas: <QuerySet [<Organisation: Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung), , Erlangen, 91058, Cauerstraße, 2999-12-31, Department Werkstoffwissenschaften, True>]>