Secondary-electron (SE) and backscattered-electron (BSE) imaging:
SE image resolution: 6 nanometers (at 30 kV accelerating voltage; 11 mm WD).
BSE image modes: composition (sum) and topography (difference).
Multi-element line analyses and area maps
Matrix corrections using ZAF.
High-speed large specimen stage (HSLSS XM-81010):
Maximum sample size: 100 x 100 x 50 mm (H).
Maximum analysable area: 90 x 90 mm.
Accelerating voltage: 0.2 to 30 kV (0.1 kV steps).
Electron probe current range: 10-12 to 10-5 A
Electron probe current stability: ± 0.5 x 10-3/h; ± 3 x 10-3/12h
Integrated visible-light microscopy: transmitted and reflected light
Description
The JEOL JXA-8200 Superprobe in our institute is a high resolution SEM and a WD/ED Combined Electron Probe Microanalyzer (EPMA). The Electron gun consists of a tungsten cathode. Five wavelength dispersive X-ray spectrometers (WDS) and an energy dispersive X-ray spectrometer (EDS) gives the possibility of efficient and accurate analysis. The WDX spectrometers are able to analyse all elements Z > 3 with different crystals (LIF, PET, TAP) and LDE1, LDE2, LDEB for light elements (Be, B, C, N, O, F). In addition one can observed specimens with a visible-light microscope (reflected and transmitted light). This equipment allows to determine the chemical composition of different samples.
The high-speed large specimen stage (HSLSS XM-81010) belongs to the Electron Probe Microanalyzer can handle samples up to 9 x 9 x 2 cm (L x B x H) through the airlock, and can reposition a sample to less than 0.5 um.
Debug: Alles
name_de: Elektronenstrahlmikrosonde (ESMA)
name_en: Electron Probe Microanalyzer (EPMA)
model: JXA-8200 Superprobe
url: https://www.gzn.nat.fau.de/mineralogie/laboratories/empa/
manufacturer: JEOL
year: 2001
location_de: Erlangen
location_en: Erlangen
usage_de: Auch für externe Nutzer
usage_en: For external users too
description_de:
description_en: The JEOL JXA-8200 Superprobe in our institute is a high resolution SEM and a WD/ED Combined Electron Probe Microanalyzer (EPMA). The Electron gun consists of a tungsten cathode. Five wavelength dispersive X-ray spectrometers (WDS) and an energy dispersive X-ray spectrometer (EDS) gives the possibility of efficient and accurate analysis. The WDX spectrometers are able to analyse all elements Z > 3 with different crystals (LIF, PET, TAP) and LDE1, LDE2, LDEB for light elements (Be, B, C, N, O, F). In addition one can observed specimens with a visible-light microscope (reflected and transmitted light). This equipment allows to determine the chemical composition of different samples.
The high-speed large specimen stage (HSLSS XM-81010) belongs to the Electron Probe Microanalyzer can handle samples up to 9 x 9 x 2 cm (L x B x H) through the airlock, and can reposition a sample to less than 0.5 um.
feature_de:
feature_en: <ul><li>Five wavelength-dispersive spectrometers (WDS):</li><li>Detectable element range: 4-Be to 92-U (all elements with Z > 3).</li><li>Eight crystal types: TAP, PETJ, PETH, LDE1, LDE2, LDEB, LIF, and LIFH.</li><li>Layered dispersive elements, gas-flow detectors allow light-element analyses.</li><li>One energy-dispersive spectrometer (EDS):</li></ul><p>Solid-state Si(Li) detector, liquid-nitrogen cooled, Ultrathin detector window.</p><ul><li>Secondary-electron (SE) and backscattered-electron (BSE) imaging:</li><li>SE image resolution: 6 nanometers (at 30 kV accelerating voltage; 11 mm WD).</li><li>BSE image modes: composition (sum) and topography (difference).</li><li>Multi-element line analyses and area maps</li><li>Matrix corrections using ZAF.</li><li>High-speed large specimen stage (HSLSS XM-81010):</li></ul><p>Maximum sample size: 100 x 100 x 50 mm (H).</p><p>Maximum analysable area: 90 x 90 mm.</p><ul><li>Accelerating voltage: 0.2 to 30 kV (0.1 kV steps).</li><li>Electron probe current range: 10-12 to 10-5 A</li><li>Electron probe current stability: ± 0.5 x 10-3/h; ± 3 x 10-3/12h</li><li>Integrated visible-light microscopy: transmitted and reflected light</li></ul>
pictures: <QuerySet []>
cards: <QuerySet [<Card: Card of Matthias, Göbbels: (True)>]>
funding_sources: <QuerySet []>
projects: <QuerySet []>
publications: <QuerySet [<Publication: Structure and principles of oxidic hexaphases: A review>]>
fobes: <QuerySet []>
orgas: <QuerySet [<Organisation: Lehrstuhl für Mineralogie, , Erlangen, 91054, Schlossgarten, 2999-12-31, GeoZentrum Nordbayern, True>]>
